Anirban Sengupta, Saumya Bhadauria. Automated design space exploration of transient fault detectable datapath based on user specified power and delay constraints. In VLSI Design, Automation and Test, VLSI-DAT 2015, Hsinchu, Taiwan, April 27-29, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.