Deepashree Sengupta, Vivek Mishra, Sachin S. Sapatnekar. Invited - Optimizing device reliability effects at the intersection of physics, circuits, and architecture. In Proceedings of the 53rd Annual Design Automation Conference, DAC 2016, Austin, TX, USA, June 5-9, 2016. pages 31, ACM, 2016. [doi]
Abstract is missing.