Application-specific worst case corners using response surfaces and statistical models - researchr publication

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Manidip Sengupta, Sharad Saxena, Lidia Daldoss, Glen Kramer, Sean Minehane, Jianjun Cheng. Application-specific worst case corners using response surfaces and statistical models. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(9):1372-1380, 2005. [doi]

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