Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction

Sungyoul Seo, Yong Lee 0002, Hyeonchan Lim, Joohwan Lee, Hongbom Yoo, Yojoung Kim, Sungho Kang. Scan Chain Reordering-Aware X-Filling and Stitching for Scan Shift Power Reduction. In 24th IEEE Asian Test Symposium, ATS 2015, Mumbai, India, November 22-25, 2015. pages 1-6, IEEE, 2015. [doi]