Process variation in near-threshold wide SIMD architectures - researchr publication authors

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Sangwon Seo, Ronald G. Dreslinski, Mark Woh, Yongjun Park, Chaitali Chakrabarti, Scott A. Mahlke, David Blaauw, Trevor N. Mudge. Process variation in near-threshold wide SIMD architectures. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 980-987, ACM, 2012. [doi]

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