Process variation in near-threshold wide SIMD architectures

Sangwon Seo, Ronald G. Dreslinski, Mark Woh, Yongjun Park, Chaitali Chakrabarti, Scott A. Mahlke, David Blaauw, Trevor N. Mudge. Process variation in near-threshold wide SIMD architectures. In Patrick Groeneveld, Donatella Sciuto, Soha Hassoun, editors, The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012. pages 980-987, ACM, 2012. [doi]

@inproceedings{SeoDWPCMBM12,
  title = {Process variation in near-threshold wide SIMD architectures},
  author = {Sangwon Seo and Ronald G. Dreslinski and Mark Woh and Yongjun Park and Chaitali Chakrabarti and Scott A. Mahlke and David Blaauw and Trevor N. Mudge},
  year = {2012},
  doi = {10.1145/2228360.2228536},
  url = {http://doi.acm.org/10.1145/2228360.2228536},
  researchr = {https://researchr.org/publication/SeoDWPCMBM12},
  cites = {0},
  citedby = {0},
  pages = {980-987},
  booktitle = {The 49th Annual Design Automation Conference 2012, DAC '12, San Francisco, CA, USA, June 3-7, 2012},
  editor = {Patrick Groeneveld and Donatella Sciuto and Soha Hassoun},
  publisher = {ACM},
  isbn = {978-1-4503-1199-1},
}