Moon-Sik Seo, Tetsuo Endoh. FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG). IEICE Transactions, 95-C(5):891-897, 2012. [doi]
@article{SeoE12,
title = {FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG)},
author = {Moon-Sik Seo and Tetsuo Endoh},
year = {2012},
url = {http://search.ieice.org/bin/summary.php?id=e95-c_5_891},
researchr = {https://researchr.org/publication/SeoE12},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {95-C},
number = {5},
pages = {891-897},
}