FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG)

Moon-Sik Seo, Tetsuo Endoh. FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG). IEICE Transactions, 95-C(5):891-897, 2012. [doi]

Abstract

Abstract is missing.