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Moon-Sik Seo, Tetsuo Endoh. FG Width Scalability of the 3-D Vertical FG NAND Using the Sidewall Control Gate (SCG). IEICE Transactions, 95-C(5):891-897, 2012. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: The Optimum Physical Targets of the 3-Dimensional Vertical FG NAND Flash Memory Cell Arrays with the Extended Sidewall Control Gate (ESCG) StructureMoon-Sik Seo, Tetsuo Endoh. ieicet, 94-C(5):686-692, 2011. [doi]
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