Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder - researchr publication authors

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Sungyoul Seo, Hyeonchan Lim, Soyeon Kang, Sungho Kang. Off-chip test architecture for improving multi-site testing efficiency using tri-state decoder and 3V-level encoder. In 18th International Symposium on Quality Electronic Design, ISQED 2017, Santa Clara, CA, USA, March 14-15, 2017. pages 191-195, IEEE, 2017. [doi]

This author has not been identified. Look up 'Sungyoul Seo' in GoogleThis author has not been identified. Look up 'Hyeonchan Lim' in GoogleThis author has not been identified. Look up 'Soyeon Kang' in GoogleThis author has not been identified. Look up 'Sungho Kang' in Google

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