Mingoo Seok, Scott Hanson, Jae-sun Seo, Dennis Sylvester, David Blaauw. Robust ultra-low voltage ROM design. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 423-426, IEEE, 2008. [doi]
@inproceedings{SeokHSSB08,
title = {Robust ultra-low voltage ROM design},
author = {Mingoo Seok and Scott Hanson and Jae-sun Seo and Dennis Sylvester and David Blaauw},
year = {2008},
doi = {10.1109/CICC.2008.4672110},
url = {http://dx.doi.org/10.1109/CICC.2008.4672110},
researchr = {https://researchr.org/publication/SeokHSSB08},
cites = {0},
citedby = {0},
pages = {423-426},
booktitle = {Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008},
publisher = {IEEE},
isbn = {978-1-4244-2018-6},
}