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Robust ultra-low voltage ROM design

Mingoo Seok, Scott Hanson, Jae-sun Seo, Dennis Sylvester, David Blaauw. Robust ultra-low voltage ROM design. In Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, CICC 2008, DoubleTree Hotel, San Jose, California, USA, September 21-24, 2008. pages 423-426, IEEE, 2008. [doi]

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