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Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper

Mingoo Seok, Peter R. Kinget, Teng Yang, Jiangyi Li, Doyun Kim. Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 5, IEEE, 2018. [doi]

Authors

Mingoo Seok

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Peter R. Kinget

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Teng Yang

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Jiangyi Li

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Doyun Kim

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