Mingoo Seok, Peter R. Kinget, Teng Yang, Jiangyi Li, Doyun Kim. Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits: Invited paper. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 5, IEEE, 2018. [doi]
Abstract is missing.