Geewhun Seok, Il-soo Lee, Tony Ambler, B. F. Womack. An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 145-156, IEEE Computer Society, 2006. [doi]
@inproceedings{SeokLAW06,
title = {An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint},
author = {Geewhun Seok and Il-soo Lee and Tony Ambler and B. F. Womack},
year = {2006},
doi = {10.1109/DFT.2006.14},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2006.14},
tags = {testing, constraints, routing, partitioning},
researchr = {https://researchr.org/publication/SeokLAW06},
cites = {0},
citedby = {0},
pages = {145-156},
booktitle = {21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2706-X},
}