Geewhun Seok, Il-soo Lee, Tony Ambler, B. F. Womack. An Efficient Scan Chain Partitioning Scheme with Reduction of Test Data under Routing Constraint. In 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 4-6 October 2006, Arlington, Virginia, USA. pages 145-156, IEEE Computer Society, 2006. [doi]
Abstract is missing.