Using Pulsed-Mode Measurements of SiGe HBTs for Non-Destructive, Improved RF-SOA Estimation

Nelson SepĂșlveda-Ramos, Harrison P. Lee, Jeffrey W. Teng, John D. Cressler. Using Pulsed-Mode Measurements of SiGe HBTs for Non-Destructive, Improved RF-SOA Estimation. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2024, Fort Lauderdale, FL, USA, October 27-30, 2024. pages 286-289, IEEE, 2024. [doi]

Abstract

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