Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems

Alejandro Serrano-Cases, Felipe Restrepo-Calle, Sergio Cuenca-Asensi, Antonio Martínez-Álvarez. Multi-Threaded Mitigation of Radiation-Induced Soft Errors in Bare-Metal Embedded Systems. J. Electronic Testing, 36(1):47-57, 2020. [doi]

Abstract

Abstract is missing.