Dominance Based Analysis for Large Volume Production Fail Diagnosis - researchr publication authors

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Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy. Dominance Based Analysis for Large Volume Production Fail Diagnosis. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 392-399, IEEE Computer Society, 2006. [doi]

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