Bharath Seshadri, Irith Pomeranz, Srikanth Venkataraman, Enamul Amyeen, Sudhakar M. Reddy. Dominance Based Analysis for Large Volume Production Fail Diagnosis. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 392-399, IEEE Computer Society, 2006. [doi]
@inproceedings{SeshadriPVAR06,
title = {Dominance Based Analysis for Large Volume Production Fail Diagnosis},
author = {Bharath Seshadri and Irith Pomeranz and Srikanth Venkataraman and Enamul Amyeen and Sudhakar M. Reddy},
year = {2006},
doi = {10.1109/VTS.2006.29},
url = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.29},
tags = {rule-based, analysis},
researchr = {https://researchr.org/publication/SeshadriPVAR06},
cites = {0},
citedby = {0},
pages = {392-399},
booktitle = {24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2514-8},
}