Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell. Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 339-348, IEEE, 2006. [doi]
@inproceedings{SethuramWCB06,
title = {Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs},
author = {Rajamani Sethuram and Seongmoon Wang and Srimat T. Chakradhar and Michael L. Bushnell},
year = {2006},
doi = {10.1109/ATS.2006.260953},
url = {https://doi.org/10.1109/ATS.2006.260953},
researchr = {https://researchr.org/publication/SethuramWCB06},
cites = {0},
citedby = {0},
pages = {339-348},
booktitle = {15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006},
publisher = {IEEE},
isbn = {0-7695-2628-4},
}