Rajamani Sethuram, Seongmoon Wang, Srimat T. Chakradhar, Michael L. Bushnell. Zero Cost Test Point Insertion Technique to Reduce Test Set Size and Test Generation Time for Structured ASICs. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 339-348, IEEE, 2006. [doi]
Abstract is missing.