Markus Seuring. Combining Scan Test and Built-in Self Test. J. Electronic Testing, 22(3):297-299, 2006. [doi]
@article{Seuring06,
title = {Combining Scan Test and Built-in Self Test},
author = {Markus Seuring},
year = {2006},
doi = {10.1007/s10836-006-8950-7},
url = {http://dx.doi.org/10.1007/s10836-006-8950-7},
tags = {testing},
researchr = {https://researchr.org/publication/Seuring06},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {22},
number = {3},
pages = {297-299},
}