Markus Seuring - researchr alias

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Viewing Publication 1 - 11 from 11

2012

Employing the STDF V4-2007 Standard for Scan Test Data LoggingMarkus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang. dt, 29(6):91-99, 2012. [doi]

2006

Combining Scan Test and Built-in Self TestMarkus Seuring. et, 22(3):297-299, 2006. [doi]

2003

Space compaction of test responses using orthogonal transmission functions [logic testing]Krishnendu Chakrabarty, Markus Seuring. tim, 52(5):1353-1362, 2003. [doi]

Multimode scan: Test per clock BIST for IP coresAdit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan. todaes, 8(4):491-505, 2003. [doi]

2000

Low Cost Concurrent Error Detection Based on Modulo Weight-Based CodesDebaleena Das, Nur A. Touba, Markus Seuring, Michael Gössel. iolts 2000: 171 [doi]

Output space compaction for testing and concurrent checkingMarkus Seuring. PhD thesis, University of Potsdam, Germany, 2000. [doi]

Space Compaction of Test Responses for IP Cores Using Orthogonal Transmission FunctionsMarkus Seuring, Krishnendu Chakrabarty. vts 2000: 213-220 [doi]

1999

A Structural Method for Output Compaction of Sequential Automata Implemented as CircuitsMarkus Seuring, Michael Gössel. wia 2001: 158-163 [doi]

A Structural Approach for Space Compaction for Sequential CircuitsMarkus Seuring, Michael Gössel. dft 1999: 227 [doi]

Testability evaluation of sequential designs incorporating the multi-mode scannable memory elementAdit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring. itc 1999: 286-293

1998

A Structural Approach for Space Compaction for Concurrent Checking and BISTMarkus Seuring, Michael Gössel, Egor S. Sogomonyan. vts 1998: 354-361 [doi]

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