Multimode scan: Test per clock BIST for IP cores

Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan. Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst., 8(4):491-505, 2003. [doi]

Abstract

Abstract is missing.