Yiorgos Sfikas, Yiorgos Tsiatouhas. Variation tolerant BTI monitoring in SRAM cells. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 100-105, IEEE, 2017. [doi]
Abstract is missing.