Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling - researchr publication authors

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Nimesh Shah, Sumon Kumar Bose, Chip-Hong Chang, Arindam Basu. Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]

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