Nimesh Shah, Sumon Kumar Bose, Chip-Hong Chang, Arindam Basu. Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling. In IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{ShahBCB20, title = {Reducing Temperature Induced Unreliability in Sub-Threshold Strong PUFs through Circuit Modeling}, author = {Nimesh Shah and Sumon Kumar Bose and Chip-Hong Chang and Arindam Basu}, year = {2020}, doi = {10.1109/ISCAS45731.2020.9180596}, url = {https://doi.org/10.1109/ISCAS45731.2020.9180596}, researchr = {https://researchr.org/publication/ShahBCB20}, cites = {0}, citedby = {0}, pages = {1-5}, booktitle = {IEEE International Symposium on Circuits and Systems, ISCAS 2020, Sevilla, Spain, October 10-21, 2020}, publisher = {IEEE}, isbn = {978-1-7281-3320-1}, }