Ankit Shah, Raman Nayyar, Arani Sinha. Silicon Proven Timing Signoff Methodology using Hazard-Free Robust Path Delay Tests. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{ShahNS19, title = {Silicon Proven Timing Signoff Methodology using Hazard-Free Robust Path Delay Tests}, author = {Ankit Shah and Raman Nayyar and Arani Sinha}, year = {2019}, doi = {10.1109/VTS.2019.8758603}, url = {https://doi.org/10.1109/VTS.2019.8758603}, researchr = {https://researchr.org/publication/ShahNS19}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019}, publisher = {IEEE}, isbn = {978-1-7281-1170-4}, }