Prediction of gate delay variation for CNFET under CNT density variation

Ali Arabi M. Shahi, Payman Zarkesh-Ha. Prediction of gate delay variation for CNFET under CNT density variation. In 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2012, Austin, TX, USA, October 3-5, 2012. pages 140-145, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.