Bijan Shahriari, Farid N. Najm. Fast Electromigration Simulation for Chip Power Grids. In 24th International Symposium on Quality Electronic Design, ISQED 2023, San Francisco, CA, USA, April 5-7, 2023. pages 1-8, IEEE, 2023. [doi]
@inproceedings{ShahriariN23,
title = {Fast Electromigration Simulation for Chip Power Grids},
author = {Bijan Shahriari and Farid N. Najm},
year = {2023},
doi = {10.1109/ISQED57927.2023.10129371},
url = {https://doi.org/10.1109/ISQED57927.2023.10129371},
researchr = {https://researchr.org/publication/ShahriariN23},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {24th International Symposium on Quality Electronic Design, ISQED 2023, San Francisco, CA, USA, April 5-7, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3475-3},
}