The following publications are possibly variants of this publication:
- Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper)Farid N. Najm, Valeriy Sukharev. irps 2019: 1-10 [doi]
- Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power GridsValeriy Sukharev, Armen Kteyan, Farid N. Najm, Yong Hyeon Yi, Chris H. Kim, Jun-Ho Choy, Sofya Torosyan, Yu Zhu. tcad, 41(11):4837-4850, 2022. [doi]