Yield and Cost Analysis of a Reliable NoC

Saeed Shamshiri, Kwang-Ting Cheng. Yield and Cost Analysis of a Reliable NoC. In 27th IEEE VLSI Test Symposium, VTS 2009, May 3-7, 2009, Santa Cruz, California, USA. pages 173-178, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.