Saeed Shamshiri, Kwang-Ting Cheng. Error-locality-aware linear coding to correct multi-bit upsets in SRAMs. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 202-211, IEEE, 2010. [doi]
@inproceedings{ShamshiriC10-0,
title = {Error-locality-aware linear coding to correct multi-bit upsets in SRAMs},
author = {Saeed Shamshiri and Kwang-Ting Cheng},
year = {2010},
doi = {10.1109/TEST.2010.5699220},
url = {http://dx.doi.org/10.1109/TEST.2010.5699220},
researchr = {https://researchr.org/publication/ShamshiriC10-0},
cites = {0},
citedby = {0},
pages = {202-211},
booktitle = {2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010},
editor = {Ron Press and Erik H. Volkerink},
publisher = {IEEE},
isbn = {978-1-4244-7206-2},
}