Kaveh Shamsi, Meng Li 0004, David Z. Pan, Yier Jin. KC2: Key-Condition Crunching for Fast Sequential Circuit Deobfuscation. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019. pages 534-539, IEEE, 2019. [doi]
@inproceedings{Shamsi0PJ19,
title = {KC2: Key-Condition Crunching for Fast Sequential Circuit Deobfuscation},
author = {Kaveh Shamsi and Meng Li 0004 and David Z. Pan and Yier Jin},
year = {2019},
doi = {10.23919/DATE.2019.8715053},
url = {https://doi.org/10.23919/DATE.2019.8715053},
researchr = {https://researchr.org/publication/Shamsi0PJ19},
cites = {0},
citedby = {0},
pages = {534-539},
booktitle = {Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019},
publisher = {IEEE},
isbn = {978-3-9819263-2-3},
}