Weiwei Shan, Wentao Dai, Chuan Zhang, Hao Cai, Peiye Liu, Jun Yang 0006, Longxing Shi. TG-SPP: A One-Transmission-Gate Short-Path Padding for Wide-Voltage-Range Resilient Circuits in 28-nm CMOS. J. Solid-State Circuits, 55(5):1422-1436, 2020. [doi]
@article{ShanDZCLYS20,
title = {TG-SPP: A One-Transmission-Gate Short-Path Padding for Wide-Voltage-Range Resilient Circuits in 28-nm CMOS},
author = {Weiwei Shan and Wentao Dai and Chuan Zhang and Hao Cai and Peiye Liu and Jun Yang 0006 and Longxing Shi},
year = {2020},
doi = {10.1109/JSSC.2019.2948164},
url = {https://doi.org/10.1109/JSSC.2019.2948164},
researchr = {https://researchr.org/publication/ShanDZCLYS20},
cites = {0},
citedby = {0},
journal = {J. Solid-State Circuits},
volume = {55},
number = {5},
pages = {1422-1436},
}