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Weiwei Shan, Wentao Dai, Chuan Zhang, Hao Cai, Peiye Liu, Jun Yang 0006, Longxing Shi. TG-SPP: A One-Transmission-Gate Short-Path Padding for Wide-Voltage-Range Resilient Circuits in 28-nm CMOS. J. Solid-State Circuits, 55(5):1422-1436, 2020. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Short-path Padding Method for Timing Error Resilient Circuits based on Transmission Gates InsertionWentao Dai, Peiye Liu, Weiwei Shan. glvlsi 2018: 105-110 [doi] An Error-Resilient RISC-V Microprocessor With a Fully Integrated DC-DC Voltage Regulator for Near-Threshold Operation in 28-nm CMOSBing-Chen Wu, Wei-Ting Chen, Tsung-Te Liu. jssc, 58(11):3275-3285, November 2023. [doi]
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