Chao-Jun Shang, Cheng-Hung Wu, Kuen-Jong Lee, Yu-Hsiang Chen. A Novel Test Generation Method for Small-Delay Defects with User-Defined Fault Model. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.