On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs - researchr publication authors

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Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, H. Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava. On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4, IEEE, 2018. [doi]

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