Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, H. Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava. On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4, IEEE, 2018. [doi]
Abstract is missing.