Dynamic performance of graded channel DG FD SOI n-MOSFETs for minimizing the gate misalignment effect - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Rupendra Kumar Sharma, Ritesh Gupta, Mridula Gupta, R. S. Gupta. Dynamic performance of graded channel DG FD SOI n-MOSFETs for minimizing the gate misalignment effect. Microelectronics Reliability, 49(7):699-706, 2009. [doi]

This author has not been identified. Look up 'Rupendra Kumar Sharma' in GoogleThis author has not been identified. Look up 'Ritesh Gupta' in GoogleThis author has not been identified. Look up 'Mridula Gupta' in GoogleThis author has not been identified. Look up 'R. S. Gupta' in Google

runs on WebDSL