Rupendra Kumar Sharma, Ritesh Gupta, Mridula Gupta, R. S. Gupta. Dynamic performance of graded channel DG FD SOI n-MOSFETs for minimizing the gate misalignment effect. Microelectronics Reliability, 49(7):699-706, 2009. [doi]
@article{SharmaGGG09,
title = {Dynamic performance of graded channel DG FD SOI n-MOSFETs for minimizing the gate misalignment effect},
author = {Rupendra Kumar Sharma and Ritesh Gupta and Mridula Gupta and R. S. Gupta},
year = {2009},
doi = {10.1016/j.microrel.2009.03.023},
url = {http://dx.doi.org/10.1016/j.microrel.2009.03.023},
researchr = {https://researchr.org/publication/SharmaGGG09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {7},
pages = {699-706},
}