Dynamic performance of graded channel DG FD SOI n-MOSFETs for minimizing the gate misalignment effect

Rupendra Kumar Sharma, Ritesh Gupta, Mridula Gupta, R. S. Gupta. Dynamic performance of graded channel DG FD SOI n-MOSFETs for minimizing the gate misalignment effect. Microelectronics Reliability, 49(7):699-706, 2009. [doi]

Abstract

Abstract is missing.