Pulkit Sharma, Anil Kumar Gundu, M. S. Hashmi. Modeling and yield estimation of SRAM sub-system for different capacities subjected to parametric variations. In 20th International Symposium on VLSI Design and Test, VDAT 2016, Guwahati, India, May 24-27, 2016. pages 1-6, IEEE, 2016. [doi]
Abstract is missing.