Combination of Structural and State Analysis for Partial Scan

Sameer Sharma, Michael S. Hsiao. Combination of Structural and State Analysis for Partial Scan. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 134, IEEE Computer Society, 2001. [doi]

Authors

Sameer Sharma

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Michael S. Hsiao

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