Sameer Sharma, Michael S. Hsiao. Combination of Structural and State Analysis for Partial Scan. In 14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India. pages 134, IEEE Computer Society, 2001. [doi]
@inproceedings{SharmaH01, title = {Combination of Structural and State Analysis for Partial Scan}, author = {Sameer Sharma and Michael S. Hsiao}, year = {2001}, doi = {10.1109/ICVD.2001.902652}, url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.2001.902652}, tags = {analysis}, researchr = {https://researchr.org/publication/SharmaH01}, cites = {0}, citedby = {0}, pages = {134}, booktitle = {14th International Conference on VLSI Design (VLSI Design 2001), 3-7 January 2001, Bangalore, India}, publisher = {IEEE Computer Society}, isbn = {0-7695-0831-6}, }