Finding a Small Set of Longest Testable Paths that Cover Every Gate

Manish Sharma, Janak H. Patel. Finding a Small Set of Longest Testable Paths that Cover Every Gate. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 974-982, IEEE Computer Society, 2002. [doi]

Authors

Manish Sharma

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Janak H. Patel

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