Manish Sharma, Janak H. Patel. Finding a Small Set of Longest Testable Paths that Cover Every Gate. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 974-982, IEEE Computer Society, 2002. [doi]
@inproceedings{SharmaP02,
title = {Finding a Small Set of Longest Testable Paths that Cover Every Gate},
author = {Manish Sharma and Janak H. Patel},
year = {2002},
url = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430974abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/SharmaP02},
cites = {0},
citedby = {0},
pages = {974-982},
booktitle = {Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002},
publisher = {IEEE Computer Society},
}