Manisha Sharma, Hokyung Park, Yinghong Zhao, Ki-Don Lee, Liangshan Chen, Joonah Yoon, Rakesh Ranjan, Caleb Dongkyan Kwon, Hyewon Shim, Myungsoo Yeo, Shin-Young Chung, Jon Haefner. Polarity Dependency of MOL-TDDB in FinFET. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-3, IEEE, 2023. [doi]
@inproceedings{SharmaPZLCYRKSYCH23,
title = {Polarity Dependency of MOL-TDDB in FinFET},
author = {Manisha Sharma and Hokyung Park and Yinghong Zhao and Ki-Don Lee and Liangshan Chen and Joonah Yoon and Rakesh Ranjan and Caleb Dongkyan Kwon and Hyewon Shim and Myungsoo Yeo and Shin-Young Chung and Jon Haefner},
year = {2023},
doi = {10.1109/IRPS48203.2023.10117774},
url = {https://doi.org/10.1109/IRPS48203.2023.10117774},
researchr = {https://researchr.org/publication/SharmaPZLCYRKSYCH23},
cites = {0},
citedby = {0},
pages = {1-3},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
publisher = {IEEE},
isbn = {978-1-6654-5672-2},
}