Strained Si: Opportunities and challenges in nanoscale MOSFET

Rajneesh Sharma, Ashwani K. Rana. Strained Si: Opportunities and challenges in nanoscale MOSFET. In 2nd IEEE International Conference on Recent Trends in Information Systems, ReTIS 2015, Kolkata, India, July 9-11, 2015. pages 475-480, IEEE, 2015. [doi]

Abstract

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